Accelerate burn-in and fault detection with cryptographic-grade pattern generation. Drift Systems replaces linear LFSRs with Arithmetic Chaos to hit corner cases and thermal limits 40% faster.
Compare the fault coverage speed of a standard LFSR (Linear) versus the Drift Core (Chaotic). Watch how "Linear Dependencies" cause the LFSR to miss complex gate interactions, while Drift saturates the die.
Note: "Linear" mode simulates LFSR cyclic dependencies which leave coverage gaps.
Every second on the tester costs money. By generating Maximum Entropy vectors, Drift Systems triggers "Hard-to-detect" faults (resistive bridges, crosstalk) in fewer cycles than weighted LFSRs.
Hardware Trojans often hide behind "rare trigger" logic (e.g., "activate only if A, B, and C are high"). Drift's Ergodicity Guarantee ensures these rare states are visited, exposing the payload during test.
Prevent "Scan Dumping" of secrets. Drift can act as a Keyed Pattern Generator. Without the correct seed, the scan chain fills with chaotic noise, protecting IP from reverse engineering during test.
Drift sequences are sensitive to path delays. By measuring the "Drift Rate" of a specific logic cone, we can detect NBTI/HCI Aging (silicon wear-out) before it causes a system failure.